| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 1 Mar 2015 | SERC | Institute of Microelectronics | Failure Mechanism for Fine Pitch Microbump in Cu/Sn/Cu System During Current Stressing | Tai Chong Chai, Hsiang-Yao Hsiao, Alastair David Trigg | IEEE Transactions on Components, Packaging and Manufacturing Technology |