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Publication date Communities Collections Article title Author(s) Journal/Conference
1 Oct 2020 SERC Institute of Materials Research and Engineering Fatigue Life Enhancement in Alpha/Beta Ti-6Al-4V after Shot Peening: An EBSD and TEM Crystallographic Orientation Mapping Study of Surface Layer Zheng Zhang, Ming Lin, Debbie Hwee Leng Seng, Siew Lang Teo, Fengxia Wei, Hui Ru Tan, Augustine Kok Heng Cheong, Su Hui Lim, Shijie Wang, Jisheng Pan Materialia
18 Nov 2019 SERC Institute of Materials Research and Engineering Origin of Anomalous Laminar Cracking, Volume Expansion and Weight Increase of Ti2AlC MAX Phase Powders at 600 oC Zheng Zhang, Hongmei Jin, Doreen Mei Yin Lai, Jianwei Chai, Shijie Wang, Jisheng Pan Corrosion Science
12 Nov 2018 SERC Institute of Materials Research and Engineering Interlayer interactions in 2D WS2/MoS2 heterostructures monolithically grown by in situ physical vapor deposition Weifeng Yang, Hiroyo Kawai, Michel Bosman, Baoshan Tang, Jianwei Chai, Wei Le Tay, Jing Yang, Hwee Leng Seng, Huili Zhu, Hao Gong, Hongfei Liu, Kuan Eng Johnson Goh, Shijie Wang, Dongzhi Chi Nanoscale
23 Jul 2018 SERC Institute of Microelectronics Demonstration of color display metasurfaces via immersion lithography on a 12-inch silicon wafer Ting Hu, Chih-Kuo Tseng, Yuan Hsing Fu, Zhengji Xu, Yuan Dong, Shijie Wang, Keng Heng Lai, Vladimir Bliznetsov, Shiyang Zu, Qunying Lin, Yuandong Gu Optics Express
16 Feb 2018 SERC Institute of Materials Research and Engineering Electronic properties of atomically thin MoS2 layers grown by physical vapour deposition: band structure and energy level alignment at layer/substrate interfaces Fabio Bussolotti, Jainwei Chai, Yang Ming, Hiroyo Kawai, Zheng Zhang, Shijie Wang, Swee Liang Wong, Carlos Manzano, Yuli Huang, Dongzhi Chi, Kuan Eng Johnson Goh RSC Advances
15 Mar 2017 SERC Institute of Microelectronics Study of Line-Space Pitch Multiplication Using Graphoepitaxy Directed Self-Assembly for Semiconductor Applications Shijie Wang, Wei Deng, Yong Ann Seow, Bing Chen, Qun Ying Lin Journal of Electronic Materials