| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 11 Oct 2017 | SERC | Institute of Chemical and Engineering Sciences | Zein film functionalized atomic force microscopy and Raman spectroscopic evaluations on surface differences between hard and soft wheat flour | Jin W. Kwek, Kaliramesh Siliveru, Shuying Cheng, Qisong Xu, R. P. Kingsly Ambrose | Journal of Cereal Science |