| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 7 May 2021 | SERC | Institute of Microelectronics | A Performance Study of Dielectric Metalens with Process-Induced Defects (Pending publish) | Zhou Yan Yan, Hu Ting, Li Yu, Li Nanxi, Dong Yuan, Li Dongdong, Fu Yuan-Hsing, Zhong Qize, Xu Zhengji, Zhu Shiyang, Lin Judy Qun Ying, Singh Navab |