Li, Y., Buddharaju, K., Singh, N. et al. Journal of Elec Materi (2013) 42: 1476. doi:10.1007/s11664-012-2294-0
Abstract:
Contact resistance gains prominence as feature size reduces to the nanometer length scale. This work studies the effects of electrical contact resistance on the performance of silicon nanowire-based thermoelectric coolers using COMSOL Multiphysics. The values of the contact resistance used to simulate the impact are experimentally extracted from a pair of thermoelectric legs with each leg made of top-down-fabricated 100 silicon nanowires having diameter of 100 nm. Analytical models agreeing well with the simulation results are provided. Lastly, a design methodology is proposed for optimum performance in on-chip cooling applications.
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